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Attributes
Multi scale analysis of ultra-high resolution sub micron CT system with simple and convenient anti-interference operation
$1268571.43 / platform
Reference Price1platform (Min. Order)
Ship From
Shanghai
Shipping
To be negotiated with the supplier
Customization
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Key Attributes
Details
Price Disclaimer
Brand
Endi Testing
Main application areas
Material research on lightweight composite materials such as silicon
detector
4 million pixel sCMOSChip, 6
spatial resolution
0.30μm|0.56μm|1.40μm
System Advantages
Compact design, integrated peripheral devices
Maintenance Method
regular inspection
Testing Scope
Small workpieces
encapsulation
standard
packaging
complete
Expand scanning range
1.10mm|2.10mm|5.00mm
Customizability
Customization supported
Data output format
3D model
Details
Price Disclaimer
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