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Comprehensive analysis of anti-interference design data for industrial non-destructive testing equipment of submicron CT system
$1268571.43 / platform
Reference Price1platform (Min. Order)
Ship From
Shanghai
Shipping
To be negotiated with the supplier
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Key Attributes
Details
Price Disclaimer
Brand
Endi Testing
Main application areas
Material research on lightweight composite materials such as silicon
detector
4 million pixel sCMOSChip, 6
spatial resolution
0.30μm|0.56μm|1.40μm
System Advantages
Compact design, integrated peripheral devices
Data Processing
real-time processing
Specification
complete
Usage environment
Constant temperature drying
Testing Scope
Small workpieces
Applicable subjects
Non destructive testing of cultural relics, composite materials, etc
Adaptation field
Multi-scenario
packaging
complete
Details
Price Disclaimer
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