Shanghai Ruichen Scientific Instrument Co., Ltd

Atomic Force Microscopy (AFM) has high resolution and can be operated in vacuum, gas, or liquid environments

$negotiable
Reference Price
1 (Min. Order)
Ship From
Shanghai
Shipping
To be negotiated with the supplier
Customization
For customization requests, please
Brand
Shanghai Ruichen
Does it support customized processing
Yes
XY axis scanning range
6, 20 or 24 bits, 5, 1
Z-axis scanning range
16,20 or 24bit2,4,6,
precision
0.01nm
Using optical sensors
Perform linear scanning on the Z-axis layer by layer
Vacuum sample holder
Can hold 1 ", 2", and 3 "samples
Sample
Can accommodate up to 500 grams
High performance atomic force microscope Z-axis electric platform
Range 50mm, accuracy 250nm
XY axis electric platform
Range 76mm, accuracy 50nm
optical zoom
0.7 μ m optical resolution
Sound and vibration isolation box
Sound, insulation, shock box
Place of Dispatch
Shanghai
Selling location
nationwide
Details

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