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Attributes
Single crystal silicon sample plate without background for directional cutting and testing of trace samples on XRD
$142857.14
Reference Price1piece (Min. Order)
Ship From
Guangzhou, Guangdong
Shipping
To be negotiated with the supplier
Customization
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Key Attributes
Details
Price Disclaimer
Brand
Yangrui
Does it support customized processing
No
Is it imported
Yes
material
monocrystalline silicon
measurement range
Trace sample N
Operating temperature
26℃
Specification
Used for XRD testing in mm
structure
Directional cutting
type
Background free monocrystalline silicon sample plate
Scope of application
spectral analysis
transmittance
High%
Model number
Custom model
color
grayish white
Effective diameter
Customized size mm
weight
Customize kg according to actual size
Number of cartons
1
Measurement object
Horizontal θ/θ angle measuring instrument
detector
Point probing, line probing, and surface probing
X-ray generator
9kW and 3KW
pattern
2D、1D、0D
Details
Price Disclaimer
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