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Attributes
Three dimensional scanning ultra-high resolution sub micron CT system with low maintenance cost and comprehensive data analysis
$1268571.43 / platform
Reference Price1platform (Min. Order)
Ship From
Shanghai
Shipping
To be negotiated with the supplier
Customization
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Key Attributes
Details
Price Disclaimer
Brand
Endi Testing
Main application areas
Material research on lightweight composite materials such as silicon
detector
4 million pixel sCMOSChip, 6
spatial resolution
0.30μm|0.56μm|1.40μm
System Advantages
Compact design, integrated peripheral devices
Data output format
3D model
Customizability
Customization supported
Specification
complete
Device Type
Industrial CT System
Device dimensions
Customizable
Testing purpose
multi-type
Application Industry
Materials Research, Lightweight Composite Materials Division
Details
Price Disclaimer
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