Boyue Instrument (Shanghai) Co., Ltd
6yearsOS 3.5

Bruker atomic force microscope AFM probe FASTSCAN-A material sample tapping mode

$1399.43
Reference Price
1box (Min. Order)
AFM probe
FASTSCAN-A
$1399.43
Ship From
Shanghai, Shanghai
Shipping
To be negotiated with the supplier
Customization
For customization requests, please
Brand
Brook
Is it imported
Yes
Operation method
Suitable for Atomic Force Microscopy (AFM)
Measurement object
Material sample
test scope
Suitable for material samples
type
AFM probe
Scope of application
Material sample
kind
Atomic force microscope probe
Product Name
Atomic force microscope probe
Product Model
FASTSCAN-A
Applicable
Material sample
Measurement Mode
Tapping Mode
Material
silicon nitride
Specification
A box of 10 pieces
characteristics
Rapid imaging
Feature 2
High resolution imaging
Details







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