Nanjing Kaishimai Technology Co., Ltd

Kaisimai Semiconductor Material Laser Scanning Confocal Microscope Non destructive Testing Industrial Quality Inspection

$50000.00 ~ 78571.43
Reference Price
1platform (Min. Order)
price range
lowest price
$50000.00
highest price
$78571.43
Ship From
Shanghai, Shanghai
Shipping
To be negotiated with the supplier
Customization
For customization requests, please
Brand
Kaishi Mai
Product Model
KC series
Z-axis resolution
2nm
Measurable maximum surface slope
±46.5°
Focusing Z-axis drive mode
electric
XY electric displacement table load
5kg
Sampling frequency of point cloud
100Hz~10000Hz
Application scenarios
Semiconductor field, precision manufacturing, new material research and development, etc
Measure camera resolution
1200W
3D point cloud construction method
Scan point by point
XY platform displacement stroke/mm
158×128
Is it imported
No
Advantage
non-contact
scanning method
Point Scan
Details






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