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Attributes
Multi scale analysis of ultra-high resolution sub micron CT system with low maintenance cost and accurate identification of micro defects
$1268571.43 / platform
Reference Price1platform (Min. Order)
Ship From
Shanghai
Shipping
To be negotiated with the supplier
Customization
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Key Attributes
Details
Price Disclaimer
Brand
Endi Testing
Main application areas
Material research on lightweight composite materials such as silicon
detector
4 million pixel sCMOSChip, 6
spatial resolution
0.30μm|0.56μm|1.40μm
System Advantages
Compact design, integrated peripheral devices
detection accuracy
Submicron scale
Application Industry
Materials Research, Lightweight Composite Materials Division
Service Type
Installation and commissioning
Expand scanning range
1.10mm|2.10mm|5.00mm
Testing purpose
multi-type
Customizability
Customization supported
hardware configuration
High sensitivity detector
Details
Price Disclaimer
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