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DIC Conductive Particle Differential Interference Metallographic Microscope for Semiconductor Wafer Inspection SGO-5232
$3857.14
Reference Price1platform (Min. Order)
magnification
50-1000
Negotiable
Ship From
Shenzhen, Guangdong
Shipping
To be negotiated with the supplier
Customization
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Key Attributes
Details
Price Disclaimer
Brand
KWONGKUK Optics Valley
Does it support customized processing
No
Specification
Complete mm
Model number
SGO-5232
Processing & Customization
Yes
Place of Origin
CHINA
Is it imported
No
Order Number
DH5525
type
metallographic microscope
Item number
DV885
Eyepiece magnification
10 times
Objective magnification
5-10-20-50X
Instrument magnification factor
50X-500X
weight
12000g
Scope of application
DIC detection
Is it a cross-border export exclusive source of goods
No
Details
Price Disclaimer
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