Olympus Semiconductor Testing Metallographic Microscope MX63 Supports Automatic Wafer Defect Density Inspection

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Olympus Semiconductor Testing Metallographic Microscope MX63 Supports Automatic Wafer Defect Density Inspection

$28571.43

Reference Price

1platform (Min. Order)

color

live shooting

Negotiable

Ship From

Shanghai

Shipping

To be negotiated with the supplier

Customization

For customization requests, please

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Brand

Olympus

Does it support customized processing

Model number

DSX1000

Stage adjustment

Electric XY stage, rotatable (+90)

Ease of operation

easy to use

Rated voltage

100V~240V

Number of lenses

15 of them

Observation method

six types

Characteristics of microscope

High resolution images, accuracy, and precision

Mirror changing dial

Fixed 4-hole objective lens turntable

Overall dimensions

198W×258D×384H

Applicable scenarios

Various observations and analyses

weight

About 5.9kg

Algorithm features

Newly developed algorithm, fast 3D image acquisition speed

Calibration Service

Calibrate according to the user's work environment

Rated current

0.4A

Device Function

Provide entry-level and advanced features

optical system

UIS2 optical system

after-sales service

After-sales guarantee

magnification

20-7000X

power consumption

1.7W

Sample observation

Multi angle observation

frequency

50Hz/60Hz

Details

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